Detecting transient voltage stability and voltage sag

  1. Jurado, F.
  2. Saenz, J.R.
Aldizkaria:
COMPEL - The International Journal for Computation and Mathematics in Electrical and Electronic Engineering

ISSN: 0332-1649

Argitalpen urtea: 2004

Alea: 23

Zenbakia: 2

Orrialdeak: 392-409

Mota: Artikulua

DOI: 10.1108/03321640410510569 GOOGLE SCHOLAR