High-resolution pursuit for detecting flaw echoes close to the material surface in ultrasonic NDT
- Ruiz-Reyes, N.
- Vera-Candeas, P.
- Curpián-Alonso, J.
- Cuevas-Martínez, J.C.
- Blanco-Claraco, J.L.
ISSN: 0963-8695
Argitalpen urtea: 2006
Alea: 39
Zenbakia: 6
Orrialdeak: 487-492
Mota: Artikulua