High-resolution pursuit for detecting flaw echoes close to the material surface in ultrasonic NDT

  1. Ruiz-Reyes, N.
  2. Vera-Candeas, P.
  3. Curpián-Alonso, J.
  4. Cuevas-Martínez, J.C.
  5. Blanco-Claraco, J.L.
Journal:
NDT and E International

ISSN: 0963-8695

Year of publication: 2006

Volume: 39

Issue: 6

Pages: 487-492

Type: Article

DOI: 10.1016/J.NDTEINT.2006.02.002 GOOGLE SCHOLAR
Data source: Scopus