Fixed kernel regression for voltammogram feature extraction

  1. Acevedo Rodriguez, F.J.
  2. López-Sastre, R.J.
  3. Gil-Jiménez, P.
  4. Ruiz-Reyes, N.
  5. Maldonado Bascón, S.
Revue:
Measurement Science and Technology

ISSN: 0957-0233,  1361-6501

Année de publication: 2009

Volumen: 20

Número: 12

Type: Article

DOI: 10.1088/0957-0233/20/12/125202 GOOGLE SCHOLAR
La source de données: Scopus