Fixed kernel regression for voltammogram feature extraction

  1. Acevedo Rodriguez, F.J.
  2. López-Sastre, R.J.
  3. Gil-Jiménez, P.
  4. Ruiz-Reyes, N.
  5. Maldonado Bascón, S.
Aldizkaria:
Measurement Science and Technology

ISSN: 0957-0233,  1361-6501

Argitalpen urtea: 2009

Alea: 20

Zenbakia: 12

Mota: Artikulua

DOI: 10.1088/0957-0233/20/12/125202 GOOGLE SCHOLAR
Datuen iturria: Scopus