Extend Tversky’s Ratio Model to an Asymmetric Similarity Measurement Model with Three Conditional Parameters: 3p-ASM Model
- He, W.
- Dutta, B.
- Liu, Y.
- Rodríguez, R.M.
ISSN: 1875-6883, 1875-6891
Année de publication: 2023
Volumen: 16
Número: 1
Type: Article