Extend Tversky’s Ratio Model to an Asymmetric Similarity Measurement Model with Three Conditional Parameters: 3p-ASM Model

  1. He, W.
  2. Dutta, B.
  3. Liu, Y.
  4. Rodríguez, R.M.
Aldizkaria:
International Journal of Computational Intelligence Systems

ISSN: 1875-6883,  1875-6891

Argitalpen urtea: 2023

Alea: 16

Zenbakia: 1

Mota: Artikulua

DOI: 10.1007/S44196-023-00285-8 GOOGLE SCHOLAR lock_openSarbide irekia editor
Datuen iturria: Scopus