Analysis and validation of IEC 61131-3 applications using a MDE approach

  1. Marcos, M.
  2. Estévez, E.
  3. Iriondo, N.
  4. Orive, D.
Konferenzberichte:
Proceedings of the 15th IEEE International Conference on Emerging Technologies and Factory Automation, ETFA 2010

ISBN: 9781424468508

Datum der Publikation: 2010

Art: Konferenz-Beitrag

DOI: 10.1109/ETFA.2010.5641238 GOOGLE SCHOLAR
Datenquelle: Scopus